ASTM F773-1992 测量线性集成电路的剂量反应率
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【英文标准名称】:PracticeforMeasuringDoseRateResponseofLinearIntegratedCircuits
【原文标准名称】:测量线性集成电路的剂量反应率
【标准号】:ASTMF773-1992
【标准状态】:作废
【国别】:
【发布日期】:1992
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:集成电路;电子工程;测量
【英文主题词】:Circuitry;Currentmeasurement-semiconductors;Destructivetesting-semiconductors;Doseratethreshold;Dosimetry;Electricalconductors-semiconductors;Electronlinearaccelerator;Flashx-raymachines(FXR);Integratedcircuits;Ionizingradiat
【摘要】:1.1Thispracticecoversthemeasurementoftheresponseoflinearintegratedcircuits,undergivenoperatingconditions,topulsedionizingradiation.Theresponsemaybeeithertransientormorelasting,suchaslatchup.TheradiationsourceiseitheraflashX-raymachine(FXR)oranelectronlinearaccelerator(LINAC).1.2Theprecisionofthemeasurementdependsonthehomogeneityoftheradiationfieldandontheprecisionoftheradiationdosimetryandtherecordinginstrumentation.1.3Thetestmaybeconsideredtobedestructiveeitherforfurthertestsorforotherpurposesifthetotalradiationdoseexceedssomepredeterminedlevel.Becausethisleveldependsbothonthekindofintegratedcircuitandontheapplication,aspecificvaluemustbeagreeduponbythepartiestothetest.(See6.10.)1.4Setup,calibration,andtestcircuitevaluationproceduresareincludedinthispractice.1.5Proceduresforlotqualificationandsamplingarenotincludedinthispractice.1.6Becauseresponsevarieswithdifferentdevicetypes,thedoseraterangeforanyspecifictestisnotgiveninthispracticebutmustbeagreeduponbythepartiestothetest.1.7Thisstandarddoesnotpurporttoaddressallofthesafetyproblems,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.Specifichazardstatementisgivenin7.9.2.
【中国标准分类号】:L55
【国际标准分类号】:31_200
【页数】:5P.;A4
【正文语种】:
【原文标准名称】:测量线性集成电路的剂量反应率
【标准号】:ASTMF773-1992
【标准状态】:作废
【国别】:
【发布日期】:1992
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:集成电路;电子工程;测量
【英文主题词】:Circuitry;Currentmeasurement-semiconductors;Destructivetesting-semiconductors;Doseratethreshold;Dosimetry;Electricalconductors-semiconductors;Electronlinearaccelerator;Flashx-raymachines(FXR);Integratedcircuits;Ionizingradiat
【摘要】:1.1Thispracticecoversthemeasurementoftheresponseoflinearintegratedcircuits,undergivenoperatingconditions,topulsedionizingradiation.Theresponsemaybeeithertransientormorelasting,suchaslatchup.TheradiationsourceiseitheraflashX-raymachine(FXR)oranelectronlinearaccelerator(LINAC).1.2Theprecisionofthemeasurementdependsonthehomogeneityoftheradiationfieldandontheprecisionoftheradiationdosimetryandtherecordinginstrumentation.1.3Thetestmaybeconsideredtobedestructiveeitherforfurthertestsorforotherpurposesifthetotalradiationdoseexceedssomepredeterminedlevel.Becausethisleveldependsbothonthekindofintegratedcircuitandontheapplication,aspecificvaluemustbeagreeduponbythepartiestothetest.(See6.10.)1.4Setup,calibration,andtestcircuitevaluationproceduresareincludedinthispractice.1.5Proceduresforlotqualificationandsamplingarenotincludedinthispractice.1.6Becauseresponsevarieswithdifferentdevicetypes,thedoseraterangeforanyspecifictestisnotgiveninthispracticebutmustbeagreeduponbythepartiestothetest.1.7Thisstandarddoesnotpurporttoaddressallofthesafetyproblems,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.Specifichazardstatementisgivenin7.9.2.
【中国标准分类号】:L55
【国际标准分类号】:31_200
【页数】:5P.;A4
【正文语种】:
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